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X-RAY DIFFRACTION
Materials and Methods page
2WUT
  •   Crystallization Hide
    Crystallization Experiments
    pH 8.5
    Details pH 8.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 66.33 α = 90
    b = 66.33 β = 90
    c = 101.22 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2009-04-22
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-1
    Wavelength 0.9334
    Site ESRF
    Beamline ID14-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.85
    Resolution(Low) 20
    Number Reflections(Observed) 19658
    Percent Possible(Observed) 98.5
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 23.8
    Redundancy 6.6
     
    High Resolution Shell Details
    Resolution(High) 1.85
    Resolution(Low) 1.9
    Percent Possible(All) 87.8
    R Merge I(Observed) 0.64
    Mean I Over Sigma(Observed) 2.3
    Redundancy 4.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.85
    Resolution(Low) 19.377
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 19657
    Number of Reflections(R-Free) 983
    Percent Reflections(Observed) 98.65
    R-Factor(Observed) 0.1685
    R-Work 0.1664
    R-Free 0.2092
     
    Temperature Factor Modeling
    Mean Isotropic B Value 28.9
    Anisotropic B[1][1] 4.3195
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 4.3195
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -8.639
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.85
    Shell Resolution(Low) 1.9474
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2429
    R-Factor(R-Work) 0.2385
    R-Factor(R-Free) 0.2622
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9474
    Shell Resolution(Low) 2.0693
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.1951
    R-Factor(R-Free) 0.2712
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0693
    Shell Resolution(Low) 2.2288
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1743
    R-Factor(R-Free) 0.2224
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2288
    Shell Resolution(Low) 2.4527
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.1662
    R-Factor(R-Free) 0.207
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4527
    Shell Resolution(Low) 2.8067
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.158
    R-Factor(R-Free) 0.2037
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8067
    Shell Resolution(Low) 3.5327
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2733
    R-Factor(R-Work) 0.1497
    R-Factor(R-Free) 0.2131
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5327
    Shell Resolution(Low) 19.3782
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2879
    R-Factor(R-Work) 0.1576
    R-Factor(R-Free) 0.1854
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 14.899
    f_angle_d 1.001
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1048
    Nucleic Acid Atoms 0
    Heterogen Atoms 25
    Solvent Atoms 275
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER