X-RAY DIFFRACTION Experimental Data & Validation


Lost? View more X-Ray Crystallographic info.

Crystallization

Crystalization Experiments
Details 2.4 M (NH4)2HPO4, 100 MM TRIS PH 8.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 56.34 α = 90
b = 56.34 β = 90
c = 56.34 γ = 90
Symmetry
Space Group I 21 3

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA -- SLS X10SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.35 18 99.4 0.03 -- -- 2.83 -- 6605 -- 0.0 23.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.35 1.44 99.7 0.5 -- 2.08 2.76 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.36 17.85 -- -- -- 6254 331 99.67 -- 0.14359 0.14154 0.18378 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.355 1.39 -- 24 439 0.202 0.282 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 16.774
RMS Deviations
Key Refinement Restraint Deviation
r_sphericity_bonded 2.552
r_sphericity_free 2.768
r_rigid_bond_restr 2.067
r_scangle_it 7.692
r_scbond_it 5.215
r_mcangle_it 4.541
r_mcbond_other 1.751
r_mcbond_it 3.155
r_gen_planes_other 0.0
r_gen_planes_refined 0.003
r_chiral_restr 0.045
r_dihedral_angle_4_deg 2.869
r_dihedral_angle_3_deg 13.091
r_dihedral_angle_2_deg 31.842
r_dihedral_angle_1_deg 4.426
r_angle_other_deg 0.859
r_angle_refined_deg 0.876
r_bond_other_d 0.002
r_bond_refined_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 241
Nucleic Acid Atoms 0
Heterogen Atoms 3
Solvent Atoms 58

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
SHELX Structure Solution
REFMAC 5.5.0072 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.5.0072 refinement
SHELX model building