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X-RAY DIFFRACTION
Materials and Methods page
2WQ1
  •   Crystallization Hide
    Crystallization Experiments
    Details 20% (W/V) PEG 3350, 200 MM NABR, 100 MM BIS-TRIS PROPANE PH 8.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 56.58 α = 90
    b = 56.58 β = 90
    c = 56.58 γ = 90
     
    Space Group
    Space Group Name:    I 21 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength 0.9184
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.08
    Resolution(Low) 18
    Number Reflections(Observed) 13026
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 12.0
    Redundancy 4.11
     
    High Resolution Shell Details
    Resolution(High) 1.08
    Resolution(Low) 1.15
    Percent Possible(All) 98.8
    R Merge I(Observed) 0.66
    Mean I Over Sigma(Observed) 2.01
    Redundancy 3.97
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.08
    Resolution(Low) 16.33
    Number of Reflections(Observed) 12350
    Number of Reflections(R-Free) 657
    Percent Reflections(Observed) 99.85
    R-Factor(Observed) 0.12938
    R-Work 0.12741
    R-Free 0.16748
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 11.58
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.082
    Shell Resolution(Low) 1.11
    Number of Reflections(R-Free) 48
    Number of Reflections(R-Work) 921
    R-Factor(R-Work) 0.203
    R-Factor(R-Free) 0.258
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_sphericity_bonded 6.026
    r_sphericity_free 8.898
    r_rigid_bond_restr 2.924
    r_scangle_it 8.82
    r_scbond_it 6.889
    r_mcangle_it 5.732
    r_mcbond_other 3.975
    r_mcbond_it 5.237
    r_nbd_refined 0.385
    r_gen_planes_other 0.003
    r_gen_planes_refined 0.008
    r_chiral_restr 0.137
    r_dihedral_angle_4_deg 11.299
    r_dihedral_angle_3_deg 14.385
    r_dihedral_angle_2_deg 36.995
    r_dihedral_angle_1_deg 4.897
    r_angle_other_deg 1.259
    r_angle_refined_deg 1.834
    r_bond_other_d 0.003
    r_bond_refined_d 0.019
    r_nbd_other 0.211
    r_nbtor_refined 0.184
    r_nbtor_other 0.092
    r_xyhbond_nbd_refined 0.17
    r_symmetry_vdw_refined 0.091
    r_symmetry_vdw_other 0.281
    r_symmetry_hbond_refined 0.191
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 256
    Nucleic Acid Atoms 0
    Heterogen Atoms 3
    Solvent Atoms 70
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHELX
    Structure Refinement REFMAC 5.2.0019
     
    Software
    refinement REFMAC version: 5.2.0019
    model building SHELX