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X-RAY DIFFRACTION
Materials and Methods page
2WIJ
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details 2.1 M AMMONIUM SULFATE, 100 MM MES PH 6.5, VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 155.02 α = 90
    b = 155.02 β = 90
    c = 127.22 γ = 90
     
    Space Group
    Space Group Name:    I 4 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2007-09-09
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-1
    Wavelength 0.934
    Site ESRF
    Beamline ID14-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.1
    Resolution(Low) 55.1
    Number Reflections(Observed) 45161
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.09
    Redundancy 7.3
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.2
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.28
    Mean I Over Sigma(Observed) 4.4
    Redundancy 7.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.1
    Resolution(Low) 55.05
    Number of Reflections(Observed) 43806
    Number of Reflections(R-Free) 1355
    Percent Reflections(Observed) 100.0
    R-Factor(Observed) 0.20125
    R-Work 0.19969
    R-Free 0.25277
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 35.893
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1
    Shell Resolution(Low) 2.154
    Number of Reflections(R-Free) 99
    Number of Reflections(R-Work) 3225
    R-Factor(R-Work) 0.282
    R-Factor(R-Free) 0.343
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 4.071
    r_scbond_it 2.712
    r_mcangle_it 1.818
    r_mcbond_it 1.029
    r_gen_planes_refined 0.009
    r_chiral_restr 0.121
    r_dihedral_angle_4_deg 18.42
    r_dihedral_angle_3_deg 17.54
    r_dihedral_angle_2_deg 37.501
    r_dihedral_angle_1_deg 6.564
    r_angle_refined_deg 1.782
    r_bond_refined_d 0.017
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4195
    Nucleic Acid Atoms 0
    Heterogen Atoms 163
    Solvent Atoms 342
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution XDS
    Structure Refinement REFMAC 5.4.0069
     
    Software
    refinement REFMAC version: 5.4.0069
    model building XDS