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X-RAY DIFFRACTION
Materials and Methods page
2WII
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.1
    Details 7.0% (W/V) PEG 3,350, 70 MM AMMONIUM ACETATE, PH 7.1
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 223.49 α = 90
    b = 84.95 β = 90
    c = 128.77 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2007-12-07
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength 0.9765
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.7
    Resolution(High) 2.7
    Resolution(Low) 67
    Number Reflections(Observed) 67945
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.11
    B(Isotropic) From Wilson Plot 52.69
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 2.7
    Resolution(Low) 2.85
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.61
    Mean I Over Sigma(Observed) 1.9
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.7
    Resolution(Low) 64.483
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 67887
    Number of Reflections(R-Free) 3436
    Percent Reflections(Observed) 99.56
    R-Factor(Observed) 0.2184
    R-Work 0.2167
    R-Free 0.2518
     
    Temperature Factor Modeling
    Mean Isotropic B Value 68.2
    Anisotropic B[1][1] 7.9085
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -19.1706
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.327
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7
    Shell Resolution(Low) 2.737
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.3038
    R-Factor(R-Free) 0.3496
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.737
    Shell Resolution(Low) 2.7761
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2510
    R-Factor(R-Work) 0.2914
    R-Factor(R-Free) 0.3238
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7761
    Shell Resolution(Low) 2.8175
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2547
    R-Factor(R-Work) 0.2805
    R-Factor(R-Free) 0.2959
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8175
    Shell Resolution(Low) 2.8616
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.277
    R-Factor(R-Free) 0.3116
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8616
    Shell Resolution(Low) 2.9085
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2530
    R-Factor(R-Work) 0.2727
    R-Factor(R-Free) 0.3137
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9085
    Shell Resolution(Low) 2.9586
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.2625
    R-Factor(R-Free) 0.3024
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9586
    Shell Resolution(Low) 3.0124
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2563
    R-Factor(R-Work) 0.267
    R-Factor(R-Free) 0.2774
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0124
    Shell Resolution(Low) 3.0704
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.2563
    R-Factor(R-Free) 0.3339
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0704
    Shell Resolution(Low) 3.133
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.2619
    R-Factor(R-Free) 0.3167
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.133
    Shell Resolution(Low) 3.2012
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2532
    R-Factor(R-Work) 0.2453
    R-Factor(R-Free) 0.3043
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2012
    Shell Resolution(Low) 3.2756
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2346
    R-Factor(R-Free) 0.3059
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2756
    Shell Resolution(Low) 3.3575
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2570
    R-Factor(R-Work) 0.2262
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3575
    Shell Resolution(Low) 3.4483
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2553
    R-Factor(R-Work) 0.2164
    R-Factor(R-Free) 0.2483
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4483
    Shell Resolution(Low) 3.5498
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.2116
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5498
    Shell Resolution(Low) 3.6643
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.2082
    R-Factor(R-Free) 0.2386
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6643
    Shell Resolution(Low) 3.7953
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2529
    R-Factor(R-Work) 0.2005
    R-Factor(R-Free) 0.2315
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7953
    Shell Resolution(Low) 3.9472
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.2001
    R-Factor(R-Free) 0.2341
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9472
    Shell Resolution(Low) 4.1268
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.1825
    R-Factor(R-Free) 0.2418
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1268
    Shell Resolution(Low) 4.3444
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.1755
    R-Factor(R-Free) 0.2077
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3444
    Shell Resolution(Low) 4.6165
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2584
    R-Factor(R-Work) 0.1501
    R-Factor(R-Free) 0.1788
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6165
    Shell Resolution(Low) 4.9728
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.1436
    R-Factor(R-Free) 0.1517
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9728
    Shell Resolution(Low) 5.473
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.1861
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.473
    Shell Resolution(Low) 6.2644
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.189
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2644
    Shell Resolution(Low) 7.8902
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.2006
    R-Factor(R-Free) 0.1839
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.8902
    Shell Resolution(Low) 64.5013
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2727
    R-Factor(R-Work) 0.2001
    R-Factor(R-Free) 0.2368
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.03
    f_dihedral_angle_d 14.304
    f_angle_d 0.446
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 14081
    Nucleic Acid Atoms 0
    Heterogen Atoms 189
    Solvent Atoms 172
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER