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X-RAY DIFFRACTION
Materials and Methods page
2WHQ
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 26-30 % (V/V) PEG750MME 0.1 M HEPES PH 7.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.55 α = 90
    b = 112.32 β = 90
    c = 227.06 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Collection Date 2007-02-21
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-3
    Wavelength 1.041
    Site MAX II
    Beamline I911-3
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 2.2
    Resolution(Low) 29.2
    Number Reflections(Observed) 110895
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 45.78
    Redundancy 5.7
     
    High Resolution Shell Details
    Resolution(High) 2.15
    Resolution(Low) 2.3
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.44
    Mean I Over Sigma(Observed) 4.5
    Redundancy 5.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.15
    Resolution(Low) 29.089
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 110749
    Number of Reflections(R-Free) 2191
    Percent Reflections(Observed) 99.59
    R-Factor(Observed) 0.186
    R-Work 0.1855
    R-Free 0.2119
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.8764
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.7953
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0811
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.15
    Shell Resolution(Low) 2.1967
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 6658
    R-Factor(R-Work) 0.3523
    R-Factor(R-Free) 0.3714
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1967
    Shell Resolution(Low) 2.2478
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6743
    R-Factor(R-Work) 0.2686
    R-Factor(R-Free) 0.2762
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2478
    Shell Resolution(Low) 2.304
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 6691
    R-Factor(R-Work) 0.2268
    R-Factor(R-Free) 0.2711
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.304
    Shell Resolution(Low) 2.3663
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 6720
    R-Factor(R-Work) 0.2123
    R-Factor(R-Free) 0.2668
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3663
    Shell Resolution(Low) 2.4359
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 6776
    R-Factor(R-Work) 0.2075
    R-Factor(R-Free) 0.235
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4359
    Shell Resolution(Low) 2.5145
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 6754
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.2132
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5145
    Shell Resolution(Low) 2.6043
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 6766
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.2102
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6043
    Shell Resolution(Low) 2.7085
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 6741
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.2257
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7085
    Shell Resolution(Low) 2.8316
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 6784
    R-Factor(R-Work) 0.1742
    R-Factor(R-Free) 0.2079
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8316
    Shell Resolution(Low) 2.9808
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6796
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.2064
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9808
    Shell Resolution(Low) 3.1673
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 6785
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.1891
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1673
    Shell Resolution(Low) 3.4115
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 6831
    R-Factor(R-Work) 0.1736
    R-Factor(R-Free) 0.2072
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4115
    Shell Resolution(Low) 3.7542
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 6839
    R-Factor(R-Work) 0.158
    R-Factor(R-Free) 0.1663
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7542
    Shell Resolution(Low) 4.296
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 6880
    R-Factor(R-Work) 0.1402
    R-Factor(R-Free) 0.1739
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.296
    Shell Resolution(Low) 5.4068
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6938
    R-Factor(R-Work) 0.1349
    R-Factor(R-Free) 0.1531
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4068
    Shell Resolution(Low) 29.0921
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6856
    R-Factor(R-Work) 0.1812
    R-Factor(R-Free) 0.1964
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.085
    f_dihedral_angle_d 18.237
    f_angle_d 1.235
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8313
    Nucleic Acid Atoms 0
    Heterogen Atoms 132
    Solvent Atoms 650
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution REFMAC
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building REFMAC