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X-RAY DIFFRACTION
Materials and Methods page
2W44
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 150 MM NA/K-PHOSPHATE PH 7.0 AND 7.5 % (V/V) ETHANOL
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 41.05 α = 90
    b = 88.62 β = 90
    c = 73.76 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Collection Date 2008-02-05
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-3
    Wavelength 1.0
    Site MAX II
    Beamline I911-3
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2
    Resolution(Low) 28
    Number Reflections(Observed) 8261
    Percent Possible(Observed) 87.6
    R Merge I(Observed) 0.04
    Redundancy 5.7
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.05
    Percent Possible(All) 53.5
    R Merge I(Observed) 0.2
    Mean I Over Sigma(Observed) 7.0
    Redundancy 5.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 28.34
    Number of Reflections(Observed) 7800
    Number of Reflections(R-Free) 461
    Percent Reflections(Observed) 87.7
    R-Factor(Observed) 0.208
    R-Work 0.205
    R-Free 0.258
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 23.76
    Anisotropic B[1][1] -0.93
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.76
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.17
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.05
    Number of Reflections(R-Free) 20
    Number of Reflections(R-Work) 358
    R-Factor(R-Work) 0.225
    R-Factor(R-Free) 0.264
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 3.562
    r_scbond_it 2.289
    r_mcangle_it 1.442
    r_mcbond_it 0.794
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.007
    r_chiral_restr 0.109
    r_dihedral_angle_4_deg 18.077
    r_dihedral_angle_3_deg 17.53
    r_dihedral_angle_2_deg 38.297
    r_dihedral_angle_1_deg 6.334
    r_angle_other_deg 1.023
    r_angle_refined_deg 1.571
    r_bond_other_d 0.001
    r_bond_refined_d 0.016
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1082
    Nucleic Acid Atoms 0
    Heterogen Atoms 26
    Solvent Atoms 44
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement REFMAC 5.5.0053
     
    Software
    refinement REFMAC version: 5.5.0053
    model building PHASER