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X-RAY DIFFRACTION
Materials and Methods page
2RCA
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.2
    Temperature 293.0
    Details 0.1 M NaCitrate, 17% PEG 4000, pH 6.2, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 45.92 α = 90
    b = 83.6 β = 90
    c = 145.15 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2006-10-23
     
    Diffraction Radiation
    Monochromator Si 220
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.00000
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.58
    Resolution(Low) 40
    Number Reflections(All) 76724
    Number Reflections(Observed) 76724
    Percent Possible(Observed) 92.3
    R Merge I(Observed) 0.048
    Redundancy 4.5
     
    High Resolution Shell Details
    Resolution(High) 1.58
    Resolution(Low) 1.64
    Percent Possible(All) 91.4
    R Merge I(Observed) 0.326
    Mean I Over Sigma(Observed) 3.25
    Redundancy 4.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.58
    Resolution(Low) 36.3
    Cut-off Sigma(I) 0.97931
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 65212
    Number of Reflections(Observed) 65212
    Number of Reflections(R-Free) 5502
    Percent Reflections(Observed) 92.02
    R-Factor(All) 0.19478
    R-Factor(Observed) 0.19478
    R-Work 0.1917
    R-Free 0.23133
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 19.573
    Anisotropic B[1][1] 1.38
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.65
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.73
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.58
    Shell Resolution(Low) 1.625
    Number of Reflections(R-Free) 347
    Number of Reflections(R-Work) 4606
    R-Factor(R-Work) 0.195
    R-Factor(R-Free) 0.243
    Percent Reflections(Observed) 88.67
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 2.653
    r_scbond_it 1.828
    r_mcangle_it 2.081
    r_mcbond_it 1.494
    r_symmetry_hbond_refined 0.229
    r_bond_refined_d 0.015
    r_angle_refined_deg 1.579
    r_dihedral_angle_1_deg 5.057
    r_dihedral_angle_2_deg 30.267
    r_dihedral_angle_3_deg 11.381
    r_dihedral_angle_4_deg 16.78
    r_chiral_restr 0.114
    r_gen_planes_refined 0.008
    r_nbd_refined 0.231
    r_nbtor_refined 0.316
    r_xyhbond_nbd_refined 0.185
    r_symmetry_vdw_refined 0.279
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4390
    Nucleic Acid Atoms 0
    Heterogen Atoms 16
    Solvent Atoms 527
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement REFMAC 5.3.0038
     
    Software
    refinement REFMAC version: 5.3.0038