X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.2
Temperature 293.0
Details 0.1 M NaCitrate, 17% PEG 4000, pH 6.2, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 45.92 α = 90
b = 83.6 β = 90
c = 145.15 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2006-10-23
Diffraction Radiation
Monochromator Protocol
Si 220 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.00000 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.58 40 92.3 0.048 -- -- 4.5 76724 76724 1.0 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.58 1.64 91.4 0.326 -- 3.25 4.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.58 36.3 0.97931 0.0 65212 65212 5502 92.02 0.19478 0.19478 0.1917 0.23133 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.58 1.625 -- 347 4606 0.195 0.243 -- 88.67
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 19.573
Anisotropic B[1][1] 1.38
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.65
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.73
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 2.653
r_scbond_it 1.828
r_mcangle_it 2.081
r_mcbond_it 1.494
r_symmetry_hbond_refined 0.229
r_bond_refined_d 0.015
r_angle_refined_deg 1.579
r_dihedral_angle_1_deg 5.057
r_dihedral_angle_2_deg 30.267
r_dihedral_angle_3_deg 11.381
r_dihedral_angle_4_deg 16.78
r_chiral_restr 0.114
r_gen_planes_refined 0.008
r_nbd_refined 0.231
r_nbtor_refined 0.316
r_xyhbond_nbd_refined 0.185
r_symmetry_vdw_refined 0.279
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4390
Nucleic Acid Atoms 0
Heterogen Atoms 16
Solvent Atoms 527

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
REFMAC 5.3.0038 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.3.0038 refinement