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X-RAY DIFFRACTION
Materials and Methods page
2RC7
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.2
    Temperature 293.0
    Details 0.1 M NaBr, 0.1 mM NaAcetate, 4% PEG 4000, pH 5.2, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.89 α = 90
    b = 97.57 β = 93.55
    c = 59.9 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2006-03-25
     
    Diffraction Radiation
    Monochromator Si 220
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 0.97931
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.58
    Resolution(Low) 30
    Number Reflections(All) 74941
    Number Reflections(Observed) 74941
    Percent Possible(Observed) 95.9
    R Merge I(Observed) 0.054
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 1.58
    Resolution(Low) 1.64
    Percent Possible(All) 75.3
    R Merge I(Observed) 0.209
    Mean I Over Sigma(Observed) 5.6
    Redundancy 3.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.58
    Resolution(Low) 29.89
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 71208
    Number of Reflections(Observed) 71208
    Number of Reflections(R-Free) 3768
    Percent Reflections(Observed) 95.89
    R-Factor(All) 0.14905
    R-Factor(Observed) 0.14905
    R-Work 0.14754
    R-Free 0.17714
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 13.485
    Anisotropic B[1][1] -0.05
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.04
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.05
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.58
    Shell Resolution(Low) 1.621
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3935
    R-Factor(R-Work) 0.163
    R-Factor(R-Free) 0.215
    Percent Reflections(Observed) 71.8
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 2.385
    r_scbond_it 1.594
    r_mcangle_it 1.928
    r_mcbond_it 1.287
    r_nbd_refined 0.248
    r_gen_planes_refined 0.007
    r_chiral_restr 0.104
    r_dihedral_angle_4_deg 18.55
    r_dihedral_angle_3_deg 11.247
    r_dihedral_angle_2_deg 34.517
    r_dihedral_angle_1_deg 5.004
    r_angle_refined_deg 1.46
    r_bond_refined_d 0.012
    r_nbtor_refined 0.32
    r_xyhbond_nbd_refined 0.2
    r_symmetry_vdw_refined 0.246
    r_symmetry_hbond_refined 0.175
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4492
    Nucleic Acid Atoms 0
    Heterogen Atoms 42
    Solvent Atoms 631
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement REFMAC 5.3.0038
     
    Software
    refinement REFMAC version: 5.3.0038