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X-RAY DIFFRACTION
Materials and Methods page
2QJ2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 298.0
    Details 50 mM ammonium sulfate, 26-29% PEG 4000 (w/w), 100 mM Tris-HCl pH 8.0, 0.5 mM beta-octyl glucoside, and 5% ethylene glycol , VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.4 α = 90
    b = 51.81 β = 107.87
    c = 73.17 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details monochromator Si 1 1 1
    Collection Date 2004-12-20
     
    Diffraction Radiation
    Monochromator Si 1 1 1
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 5ID-B
    Wavelength List 0.99998
    Site APS
    Beamline 5ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.8
    Resolution(Low) 22.3
    Number Reflections(All) 28061
    Number Reflections(Observed) 28061
    Percent Possible(Observed) 86.8
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 12.3
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.86
    Percent Possible(All) 31.3
    R Merge I(Observed) 0.37
    Mean I Over Sigma(Observed) 1.3
    R-Sym I(Observed) 0.37
    Redundancy 1.7
    Number Unique Reflections(All) 1004
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.81
    Resolution(Low) 22.29
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 26701
    Number of Reflections(Observed) 26701
    Number of Reflections(R-Free) 2647
    Percent Reflections(Observed) 82.4
    R-Factor(All) 0.21
    R-Factor(Observed) 0.201
    R-Work 0.201
    R-Free 0.248
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 22.7
    Anisotropic B[1][1] 2.93
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 2.41
    Anisotropic B[2][2] -1.52
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.41
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.81
    Shell Resolution(Low) 1.91
    Number of Reflections(Observed) 1575
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1429
    R-Factor(R-Work) 0.318
    R-Factor(R-Free) 0.323
    R-Free Error 0.027
    Percent Reflections(Observed) 28.8
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 3.07
    c_scbond_it 2.04
    c_mcangle_it 2.32
    c_mcbond_it 1.46
    c_improper_angle_d 0.85
    c_dihedral_angle_d 24.6
    c_angle_deg 1.2
    c_bond_d 0.006
     
    Coordinate Error
    Luzzati ESD(Observed) 0.22
    Luzzati Sigma A(Observed) 0.24
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.27
    Luzzati Sigma A(R-Free Set) 0.21
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2815
    Nucleic Acid Atoms 0
    Heterogen Atoms 20
    Solvent Atoms 330
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement CNS 1.1
     
    Software
    refinement CNS version: 1.1