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X-RAY DIFFRACTION
Materials and Methods page
2PYP
  •   Crystallization Hide
    Crystallization Experiments
    pH 4.8
    Details pH 4.8
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 66.9 α = 90
    b = 66.9 β = 90
    c = 40.8 γ = 120
     
    Space Group
    Space Group Name:    P 63
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 261
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type FUJI
    Collection Date 1993-06
     
    Diffraction Radiation
    Monochromator ALUMINUM FOIL 150 MICRON
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X26C
    Wavelength 0.7
    Wavelength List 0.7, 2.0
    Site NSLS
    Beamline X26C
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.9
    Resolution(Low) 10
    Number Reflections(Observed) 10354
    Percent Possible(Observed) 92.3
    Redundancy 5.5
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 2.1
    Percent Possible(All) 86.0
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.9
    Resolution(Low) 10.0
    Cut-off Sigma(F) 3.0
    Number of Reflections(Observed) 7392
    Percent Reflections(Observed) 89.3
    R-Factor(Observed) 0.204
    R-Work 0.204
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.99
    Number of Reflections(R-Work) 765
    R-Factor(R-Work) 0.28
    Percent Reflections(Observed) 74.34
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.013
    x_angle_deg 1.605
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 976
    Nucleic Acid Atoms 0
    Heterogen Atoms 11
    Solvent Atoms 56
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) LAUEVIEW
    Data Reduction (data scaling) LAUEVIEW
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1