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X-RAY DIFFRACTION
Materials and Methods page
2NXZ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.6
    Temperature 298.0
    Details 7.5% PEG 4000, 8.5% MPD, 100 mM Na Citrate, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 71.92 α = 90
    b = 88.13 β = 90
    c = 197.68 γ = 90
     
    Space Group
    Space Group Name:    P 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 225 mm
    Collection Date 2003-02-13
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength 0.9794
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.04
    Resolution(Low) 50
    Number Reflections(All) 80471
    Number Reflections(Observed) 74195
    Percent Possible(Observed) 92.2
    R Merge I(Observed) 0.114
    Redundancy 4.5
     
    High Resolution Shell Details
    Resolution(High) 2.04
    Resolution(Low) 2.12
    Percent Possible(All) 68.2
    R Merge I(Observed) 0.505
    Redundancy 2.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.04
    Resolution(Low) 35.38
    Number of Reflections(all) 80742
    Number of Reflections(Observed) 66733
    Number of Reflections(R-Free) 3578
    Percent Reflections(Observed) 87.08
    R-Factor(Observed) 0.20821
    R-Work 0.20629
    R-Free 0.24425
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 25.41
    Anisotropic B[1][1] 0.44
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.33
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.11
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.04
    Shell Resolution(Low) 2.094
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2847
    R-Factor(R-Work) 0.292
    R-Factor(R-Free) 0.302
    Percent Reflections(Observed) 50.95
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 1.803
    r_scbond_it 1.058
    r_mcangle_it 0.688
    r_mcbond_it 0.39
    r_nbd_refined 0.207
    r_gen_planes_refined 0.003
    r_chiral_restr 0.063
    r_dihedral_angle_4_deg 16.279
    r_dihedral_angle_3_deg 14.13
    r_dihedral_angle_2_deg 33.93
    r_dihedral_angle_1_deg 5.28
    r_angle_refined_deg 0.997
    r_bond_refined_d 0.009
    r_nbtor_refined 0.32
    r_xyhbond_nbd_refined 0.204
    r_symmetry_vdw_refined 0.162
    r_symmetry_hbond_refined 0.285
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7105
    Nucleic Acid Atoms 0
    Heterogen Atoms 229
    Solvent Atoms 563
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement REFMAC 5.2.0005
     
    Software
    data extraction pdb_extract version: 2.000
    refinement REFMAC5 version: 5.2.0005
    data processing HKL