X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 5.5
Temperature 293.0
Details 0.2M (NH4)2SO4, 0.1M Bis-Tris, pH 5.5, 25% PEG3350 , VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 100.63 α = 90
b = 100.63 β = 90
c = 145.36 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2006-05-06
Diffraction Radiation
Monochromator Protocol
Si (111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.97925 SLS X10SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 50 97.2 -- -- -- -- 20815 20470 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.7 2.75 80.2 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.71 47.6 -- 0.0 19430 19430 1040 97.42 0.20913 0.20913 0.20763 0.23632 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.71 2.777 -- 57 1144 0.322 0.367 -- 80.23
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 48.111
Anisotropic B[1][1] 2.07
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 2.07
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -4.13
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 1.47
r_scbond_it 0.895
r_mcangle_it 0.702
r_mcbond_other 0.053
r_mcbond_it 0.386
r_nbd_refined 0.213
r_gen_planes_other 0.001
r_gen_planes_refined 0.003
r_chiral_restr 0.055
r_dihedral_angle_4_deg 21.765
r_dihedral_angle_3_deg 15.248
r_dihedral_angle_2_deg 36.469
r_dihedral_angle_1_deg 5.349
r_angle_other_deg 0.806
r_angle_refined_deg 1.057
r_bond_other_d 0.001
r_bond_refined_d 0.009
r_nbd_other 0.173
r_nbtor_refined 0.186
r_nbtor_other 0.083
r_xyhbond_nbd_refined 0.141
r_metal_ion_refined 0.102
r_symmetry_vdw_refined 0.056
r_symmetry_vdw_other 0.178
r_symmetry_hbond_refined 0.027
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3399
Nucleic Acid Atoms 0
Heterogen Atoms 34
Solvent Atoms 18

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
REFMAC 5.2.0019 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.2.0019 refinement