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X-RAY DIFFRACTION
Materials and Methods page
2ID6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    Temperature 293.0
    Details 3%w/v Dextrose, 30%w/v PEG 2K MME, 0.1 M KSCN, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 55.76 α = 90
    b = 66.01 β = 90
    c = 55.62 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details mirrors
    Collection Date 2006-06-11
     
    Diffraction Radiation
    Monochromator Si 111 channel
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 1.27819
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.75
    Resolution(Low) 33.83
    Number Reflections(All) 21489
    Number Reflections(Observed) 21339
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.062
    Redundancy 7.3
     
    High Resolution Shell Details
    Resolution(High) 1.746
    Resolution(Low) 1.81
    Percent Possible(All) 98.0
    R Merge I(Observed) 0.397
    Mean I Over Sigma(Observed) 2.9
    R-Sym I(Observed) 0.365
    Redundancy 5.8
    Number Unique Reflections(All) 2043
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method isomorphous replacement
    reflnsShellList 1.746
    Resolution(Low) 33.83
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 20076
    Number of Reflections(Observed) 20076
    Number of Reflections(R-Free) 1091
    Percent Reflections(Observed) 98.6
    R-Factor(All) 0.21136
    R-Factor(Observed) 0.21136
    R-Work 0.20916
    R-Free 0.25102
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 32.019
    Anisotropic B[1][1] -0.64
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.17
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.81
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.746
    Shell Resolution(Low) 1.791
    Number of Reflections(R-Free) 87
    Number of Reflections(R-Work) 1310
    R-Factor(R-Work) 0.237
    R-Factor(R-Free) 0.361
    Percent Reflections(Observed) 90.07
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 4.379
    r_scbond_it 3.355
    r_mcangle_it 1.551
    r_mcbond_it 1.313
    r_nbd_refined 0.21
    r_gen_planes_refined 0.006
    r_chiral_restr 0.098
    r_dihedral_angle_4_deg 21.717
    r_dihedral_angle_3_deg 13.814
    r_dihedral_angle_2_deg 32.256
    r_dihedral_angle_1_deg 4.425
    r_angle_refined_deg 1.493
    r_bond_refined_d 0.022
    r_nbtor_refined 0.311
    r_xyhbond_nbd_refined 0.14
    r_symmetry_vdw_refined 0.28
    r_symmetry_hbond_refined 0.16
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1638
    Nucleic Acid Atoms 0
    Heterogen Atoms 4
    Solvent Atoms 151
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CCP4, COOT, REFMAC
    Structure Refinement REFMAC 5.2
     
    Software
    refinement REFMAC version: 5.2
    data collection HKL-2000