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X-RAY DIFFRACTION
Materials and Methods page
2H4N
  •   Crystallization Hide
    Crystallization Experiments
    pH 8
    Details 2M (NH4)2SO4; 100 MM TRIS PH 8.0; 5 MM N-HEXYL BETA-D-GLUCOPYRANOSIDE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.7 α = 90
    b = 41.7 β = 104.6
    c = 73 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 287
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IIC
    Details MIRRORS
    Collection Date 1996-10
     
    Diffraction Radiation
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH2R
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.9
    Resolution(Low) 20
    Number Reflections(Observed) 19350
    Percent Possible(Observed) 98.0
    R Merge I(Observed) 0.063
    B(Isotropic) From Wilson Plot 21.4
    Redundancy 2.6
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.95
    Percent Possible(All) 89.0
    R Merge I(Observed) 0.375
    Mean I Over Sigma(Observed) 1.0
    R-Sym I(Observed) 0.375
    Redundancy 2.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method DIFFERENCE FOURIER
    reflnsShellList 1.9
    Resolution(Low) 20.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 19190
    Number of Reflections(R-Free) 564
    Percent Reflections(Observed) 96.7
    R-Factor(Observed) 0.177
    R-Work 0.177
    R-Free 0.219
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 21.4
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.99
    Number of Reflections(R-Free) 61
    Number of Reflections(R-Work) 2177
    R-Factor(R-Work) 0.253
    R-Factor(R-Free) 0.288
    R-Free Error 0.039
    Percent Reflections(Observed) 90.5
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_scangle_it 2.3
    x_scbond_it 1.9
    x_mcangle_it 2.3
    x_mcbond_it 1.9
    x_improper_angle_d 1.3
    x_bond_d 0.007
    x_angle_deg 1.5
    x_dihedral_angle_d 25.2
     
    Coordinate Error
    Luzzati ESD(Observed) 0.28
    Luzzati Sigma A(Observed) 0.17
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.29
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2046
    Nucleic Acid Atoms 0
    Heterogen Atoms 15
    Solvent Atoms 49
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) CCP4
    Structure Solution X-PLOR
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR