X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Microbatch
pH 5.5
Temperature 277.0
Details 10% PEG 10K, 0.15M Ammonium Acetate, 0.1M BisTris, 10% ethylene glycol, pH 5.5, MICROBATCH, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 66.09 α = 90
b = 96.79 β = 90
c = 243.54 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 200
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2005-07-01
Diffraction Radiation
Monochromator Protocol
Si(111) double-crystal system SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 0.9796 APS 17-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.12 50 98.3 -- 0.086 -- 13.5 52029 47404 1.0 3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.12 3.23 88.2 -- 0.465 3.2 9.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SIRAS, MIRAS, MR 3.12 43.51 -- 0.0 -- 47404 4706 88.6 -- 0.273 0.273 0.34 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.12 3.32 -- 585 5103 0.436 0.478 0.02 63.3
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 103.8
Anisotropic B[1][1] 42.09
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -16.09
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -26.01
RMS Deviations
Key Refinement Restraint Deviation
c_scangle_it 28.18
c_scbond_it 19.92
c_mcangle_it 22.73
c_mcbond_it 14.64
c_improper_angle_d 1.1
c_bond_d 0.008
c_angle_deg 1.5
c_dihedral_angle_d 23.7
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.52
Luzzati Sigma A (Observed) 0.78
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.62
Luzzati Sigma A (R-Free Set) 0.7
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6330
Nucleic Acid Atoms 609
Heterogen Atoms 0
Solvent Atoms 0

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
SHARP Structure Solution
CNS 1.1 Structure Refinement
Software
Software Name Purpose
CNS version: 1.1 refinement