ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Concentration (mg/ml) 1.0
Sample pH 7.4
Sample Support Details HOLEY CARBON
Sample Vitrification Details GRIDS WERE BLOTED FOR 2-3 SECONDS AND THEN LEFT TO EQUILIBRATE FOR 2-3 SECONDS AND THEN PLUNGED INTO LIQUID ETHANE
Sample Aggregation State PARTICLE
Name of Sample GROEL-GP31-ADP
EM Data Acquisition
Date of Experiment 2004-09-28
Num of Micrographs-Images Used 28
Temperature (Kelvin) 100.0
Microscope Model FEI TECNAI F20
Detector Type KODAK SO163 FILM
Minimum Defocus (nm) 1300.0
Maximum Defocus (nm) 3300.0
Minimum Tilt Angle (degrees) --
Maximum Tilt Angle (degrees) --
Nominal CS 2.0
Imaging Mode BRIGHT FIELD
Electron Dose (electrons nm**-2) --
Illumination Mode LOW DOSE
Nominal Magnification 50000
Calibrated Magnification 50000
Source --
Acceleration Voltage (kV) 200
Imaging Details --
3D Reconstruction
Software Package(s)
Reconstruction Method PROJECTION MATCHING
EM Image Reconstruction Statistics
Number of Particles 10300
Nominal Pixel Size 1.4
Actual Pixel Size 1.4
Effective Resolution 8.2
CTF Correction Method FULL CORRECTION ON 2D CLASS AVERAGES
Other Details THE 3 DOMAINS OF TWO GROEL SUBUNITS AND A SINGLE GP31 SUBUNIT WERE DOCKED AS RIGID BODIES INTO THE DENSITY MAP
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
REAL X-RAY CROSS-CORRELATION -- RIGID BODY --