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ELECTRON MICROSCOPY
Materials and Methods page
2C7E
  •   EM Refinement Details Hide
    3D Reconstruction
    Reconstruction Method PROJECTION MATCHING-BASED ANGULAR REFINEMENT AND ITERATIVE ALGEBRAIC RECONSTRUCTION IN SPIDER
     
    EM Map-Model Fitting & Refinement
    Refinement Space REAL
    Fitting Procedure LOCAL CORRELATION USING DOCKEM
     
    EM Image Reconstruction Statistics
    Number of Particles 6404
    Actual Pixel Size 1.86
    CTF Correction Method FULL CORRECTION ON 2D CLASS AVERAGES
    Other Details RIGID BODY FITTING IN URO, AFTER A 4 PER CENT MAGNIFICATION CORRECTION BEING APPLIED TO THE EM MAP. THIS SUBMISSION REPLACES PREVIOUS ENTRY 1GR6
     
    Electron Microscope Sample
    Sample pH 7.5
    Sample Support Details HOLEY CARBON
    Sample Vitrification Details LIQUID ETHANE
    Sample Aggregation State PARTICLE
    Name of Sample GROEL(D398A)-ATP
     
    Data Acquisition
    Num of Micrographs-Images Used 160
    Temperature (Kelvin) 100.0
    Microscope Model FEI CM200 FEG
    Detector Type KODAK SO163 FILM
    Minimum Defocus (NM) 1200.0
    Maximum Defocus (NM) 5000.0
    Nominal CS 2.0
    Imaging Mode BRIGHT FIELD
    Illumination Mode LOW DOSE
    Nominal Magnification 38000
    Calibrated Magnification 37604
    Source FEG
    Acceleration Voltage (KV) 200