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X-RAY DIFFRACTION
Materials and Methods page
2BLY
  •   Crystallization Hide
    Crystallization Experiments
    Details 30 % PEG 5000 MME, 1 M SODIUM CHLORIDE,5 0 MM PH 4.5 SODIUM ACETATE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 77.32 α = 90
    b = 77.32 β = 90
    c = 38.16 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Details BENT MIRROR
    Collection Date 2004-12-18
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength 0.9392
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.4
    Resolution(Low) 50
    Number Reflections(Observed) 23305
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.05
    Redundancy 7.8
     
    High Resolution Shell Details
    Resolution(High) 1.4
    Resolution(Low) 1.49
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.29
    Mean I Over Sigma(Observed) 6.41
    Redundancy 7.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method OTHER
    reflnsShellList 1.4
    Resolution(Low) 45.0
    Number of Reflections(Observed) 22097
    Number of Reflections(R-Free) 1195
    Percent Reflections(Observed) 99.7
    R-Factor(Observed) 0.131
    R-Work 0.129
    R-Free 0.17
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 10.08
    Anisotropic B[1][1] -0.21
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.21
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.43
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4
    Shell Resolution(Low) 1.48
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3143
    R-Factor(R-Work) 0.105
    R-Factor(R-Free) 0.164
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 5.179
    r_scbond_it 3.837
    r_mcangle_it 2.893
    r_mcbond_it 2.241
    r_nbd_refined 0.229
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.011
    r_chiral_restr 0.146
    r_dihedral_angle_4_deg 17.107
    r_dihedral_angle_3_deg 11.477
    r_dihedral_angle_2_deg 33.4
    r_dihedral_angle_1_deg 6.112
    r_angle_other_deg 1.0
    r_angle_refined_deg 1.855
    r_bond_other_d 0.002
    r_bond_refined_d 0.022
    r_nbd_other 0.198
    r_nbtor_refined 0.188
    r_nbtor_other 0.092
    r_xyhbond_nbd_refined 0.313
    r_symmetry_vdw_refined 0.196
    r_symmetry_vdw_other 0.347
    r_symmetry_hbond_refined 0.358
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1001
    Nucleic Acid Atoms 0
    Heterogen Atoms 14
    Solvent Atoms 115
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHELXD, SHELXE
    Structure Refinement REFMAC 5.2.0005
     
    Software
    refinement REFMAC version: 5.2.0005
    model building SHELXE
    model building SHELXD