X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 54.16 α = 90
b = 58.25 β = 90
c = 66.58 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC BENT MIRROR 2004-12-18
Diffraction Radiation
Monochromator Protocol
SI(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 -- ESRF ID14-4

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.2 50 96.1 0.05 -- -- 2.1 -- 122363 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.2 1.3 94.0 0.14 -- 5.75 2.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
OTHER 1.2 10.0 -- -- -- 60727 3244 96.4 -- 0.108 0.107 0.13 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.2 1.26 -- 440 8508 0.101 0.133 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 6.43
Anisotropic B[1][1] 0.13
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.12
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.02
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 3.479
r_scbond_it 2.769
r_mcangle_it 2.062
r_mcbond_it 1.44
r_nbd_refined 0.211
r_gen_planes_other 0.002
r_gen_planes_refined 0.008
r_chiral_restr 0.107
r_dihedral_angle_4_deg 19.645
r_dihedral_angle_3_deg 11.015
r_dihedral_angle_2_deg 40.587
r_dihedral_angle_1_deg 6.732
r_angle_other_deg 0.907
r_angle_refined_deg 1.632
r_bond_other_d 0.001
r_bond_refined_d 0.013
r_nbd_other 0.186
r_nbtor_refined 0.178
r_nbtor_other 0.09
r_xyhbond_nbd_refined 0.24
r_symmetry_vdw_refined 0.303
r_symmetry_vdw_other 0.234
r_symmetry_hbond_refined 0.273
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1629
Nucleic Acid Atoms 0
Heterogen Atoms 36
Solvent Atoms 314

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
SHELXD, SHELXE Structure Solution
REFMAC 5.2.0005 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.2.0005 refinement
SHELXE model building
SHELXD model building