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X-RAY DIFFRACTION
Materials and Methods page
2BLR
  •   Crystallization Hide
    Crystallization Experiments
    Details .9 M SODIUM/POTASSIUM TARTRATE, .1 M HEPES, PH 7.3, 15 % GLYCEROL
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 57.78 α = 90
    b = 57.78 β = 90
    c = 150.09 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Details BENT MIRROR
    Collection Date 2004-12-18
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength 0.9392
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.4
    Resolution(Low) 50
    Number Reflections(Observed) 93386
    Percent Possible(Observed) 97.6
    R Merge I(Observed) 0.04
    Redundancy 2.5
     
    High Resolution Shell Details
    Resolution(High) 1.4
    Resolution(Low) 1.49
    Percent Possible(All) 94.8
    R Merge I(Observed) 0.26
    Mean I Over Sigma(Observed) 3.81
    Redundancy 2.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method OTHER
    reflnsShellList 1.4
    Resolution(Low) 45.0
    Number of Reflections(Observed) 47378
    Number of Reflections(R-Free) 2538
    Percent Reflections(Observed) 97.9
    R-Factor(Observed) 0.127
    R-Work 0.126
    R-Free 0.155
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 9.95
    Anisotropic B[1][1] 0.22
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.22
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.43
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4
    Shell Resolution(Low) 1.48
    Number of Reflections(R-Free) 370
    Number of Reflections(R-Work) 6647
    R-Factor(R-Work) 0.152
    R-Factor(R-Free) 0.196
    Percent Reflections(Observed) 96.19
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_sphericity_bonded 3.54
    r_sphericity_free 10.627
    r_rigid_bond_restr 1.696
    r_scangle_it 4.367
    r_scbond_it 3.482
    r_mcangle_it 2.362
    r_mcbond_other 0.787
    r_mcbond_it 1.932
    r_nbd_refined 0.21
    r_gen_planes_other 0.002
    r_gen_planes_refined 0.009
    r_chiral_restr 0.108
    r_dihedral_angle_4_deg 14.557
    r_dihedral_angle_3_deg 10.93
    r_dihedral_angle_2_deg 37.289
    r_dihedral_angle_1_deg 6.839
    r_angle_other_deg 0.863
    r_angle_refined_deg 1.664
    r_bond_other_d 0.001
    r_bond_refined_d 0.018
    r_nbd_other 0.19
    r_nbtor_refined 0.183
    r_nbtor_other 0.085
    r_xyhbond_nbd_refined 0.21
    r_symmetry_vdw_refined 0.13
    r_symmetry_vdw_other 0.287
    r_symmetry_hbond_refined 0.146
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1546
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 276
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHELXD, SHELXE
    Structure Refinement REFMAC 5.2.0005
     
    Software
    refinement REFMAC version: 5.2.0005
    model building SHELXE
    model building SHELXD