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X-RAY DIFFRACTION
Materials and Methods page
2BDE
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.15
    Temperature 293.0
    Details 100mM MES, 20% PEG400, 100mM KBr, 5mM DTT, pH 6.15, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 152.54 α = 90
    b = 152.54 β = 90
    c = 188.41 γ = 90
     
    Space Group
    Space Group Name:    I 41 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 4
    Details mirrors
    Collection Date 2005-09-16
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X4A
    Wavelength List 0.97898, 0.97943, 0.96795
    Site NSLS
    Beamline X4A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.9
    Resolution(Low) 30.12
    Number Reflections(All) 44284
    Number Reflections(Observed) 44284
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.088
    B(Isotropic) From Wilson Plot 70.2
    Redundancy 24.9
     
    High Resolution Shell Details
    Resolution(High) 2.9
    Resolution(Low) 3.0
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.338
    Mean I Over Sigma(Observed) 10.93
    R-Sym I(Observed) 0.285
    Redundancy 18.9
    Number Unique Reflections(All) 2447
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 2.9
    Resolution(Low) 30.12
    Cut-off Sigma(I) 2.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 44284
    Number of Reflections(Observed) 44284
    Number of Reflections(R-Free) 4327
    Percent Reflections(Observed) 94.0
    R-Factor(All) 0.224
    R-Factor(Observed) 0.221
    R-Work 0.221
    R-Free 0.267
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model OVERALL
    Mean Isotropic B Value 49.2
    Anisotropic B[1][1] 4.71
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 4.07
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -8.78
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9
    Shell Resolution(Low) 3.08
    Number of Reflections(Observed) 4327
    Number of Reflections(R-Free) 681
    Number of Reflections(R-Work) 5919
    R-Factor(R-Work) 0.31
    R-Factor(R-Free) 0.369
    R-Free Error 0.014
    Percent Reflections(Observed) 83.9
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_improper_angle_d 0.86
    c_dihedral_angle_d 22.4
    c_angle_deg 1.2
    c_bond_d 0.008
     
    Coordinate Error
    Luzzati ESD(Observed) 0.36
    Luzzati Sigma A(Observed) 0.43
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.44
    Luzzati Sigma A(R-Free Set) 0.52
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3758
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 71
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution BNP, SOLVE/RESOLVE
    Structure Refinement XTALVIEW, CNS 1.1
     
    Software
    refinement CNS version: 1.1