X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.15
Temperature 293.0
Details 100mM MES, 20% PEG400, 100mM KBr, 5mM DTT, pH 6.15, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 152.54 α = 90
b = 152.54 β = 90
c = 188.41 γ = 90
Symmetry
Space Group I 41 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 mirrors 2005-09-16
Diffraction Radiation
Monochromator Protocol
Si 111 CHANNEL MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.97898, 0.97943, 0.96795 NSLS X4A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.9 30.12 99.9 0.088 0.081 -- 24.9 44284 44284 0.0 0.0 70.2
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.9 3.0 100.0 0.338 0.285 10.93 18.9 2447

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.9 30.12 2.0 2.0 44284 44284 4327 94.0 0.224 0.221 0.221 0.267 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.9 3.08 4327 681 5919 0.31 0.369 0.014 83.9
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model OVERALL
Mean Isotropic B 49.2
Anisotropic B[1][1] 4.71
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 4.07
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -8.78
RMS Deviations
Key Refinement Restraint Deviation
c_improper_angle_d 0.86
c_dihedral_angle_d 22.4
c_angle_deg 1.2
c_bond_d 0.008
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.36
Luzzati Sigma A (Observed) 0.43
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.44
Luzzati Sigma A (R-Free Set) 0.52
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3758
Nucleic Acid Atoms 0
Heterogen Atoms 10
Solvent Atoms 71

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
BNP, SOLVE/RESOLVE Structure Solution
XTALVIEW, CNS 1.1 Structure Refinement
Software
Software Name Purpose
CNS version: 1.1 refinement