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X-RAY DIFFRACTION
Materials and Methods page
211D
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    Details VAPOR DIFFUSION, SITTING DROP
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 25.19 α = 90
    b = 25.19 β = 90
    c = 38.95 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 277
     
    Diffraction Detector
    Detector DIFFRACTOMETER
    Type ENRAF-NONIUS CAD4
     
    Diffraction Radiation
     
    Diffraction Source
    Source ROTATING ANODE
    Type ELLIOTT GX-21
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Resolution(High) 1.6
    Number Reflections(All) 2129
    Number Reflections(Observed) 1741
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.6
    Resolution(Low) 12.0
    Cut-off Sigma(F) 4.0
    Number of Reflections(Observed) 1583
    Percent Reflections(Observed) 70.4
    R-Factor(Observed) 0.17
    R-Work 0.17
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.009
    x_angle_deg 1.66
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 0
    Nucleic Acid Atoms 121
    Heterogen Atoms 18
    Solvent Atoms 23
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement X-PLOR
     
    Software
    refinement X-PLOR