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X-RAY DIFFRACTION
Materials and Methods page
1ZSA
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.7 α = 90
    b = 41.7 β = 104.6
    c = 73 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IIC
    Collection Date 1995-07-16
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.5
    Resolution(Low) 10
    Number Reflections(Observed) 7871
    Percent Possible(Observed) 90.0
    R Merge I(Observed) 0.08
    Redundancy 3.1
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.5
    Resolution(Low) 8.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 7328
    Percent Reflections(Observed) 87.1
    R-Factor(Observed) 0.168
    R-Work 0.168
     
    Temperature Factor Modeling
    Mean Isotropic B Value 19.7
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_improper_angle_d 1.6
    x_bond_d 0.013
    x_angle_deg 1.8
    x_dihedral_angle_d 25.9
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2048
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 41
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Structure Solution X-PLOR
    Structure Refinement X-PLOR
     
    Software
    refinement X-PLOR
    model building X-PLOR