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X-RAY DIFFRACTION
Materials and Methods page
1ZIK
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 104.31 α = 90
    b = 30.56 β = 97.37
    c = 22.33 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS
    Collection Date 1994-09
     
    Diffraction Radiation
     
    Diffraction Source
    Source SEALED TUBE
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Number Reflections(Observed) 5706
    Percent Possible(Observed) 88.0
    R Merge I(Observed) 0.053
    Redundancy 2.8
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.8
    Resolution(Low) 6.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 5706
    R-Work 0.186
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    t_angle_deg 2.1
    t_bond_d 0.015
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 512
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 34
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) R-AXIS
    Data Reduction (data scaling) R-AXIS
    Structure Refinement TNT
     
    Software
    refinement TNT