X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.5
Temperature 293.0
Details 0.05M Na citrate, 30% w/v PEG 2K MME, 0.1M KSCN, pH 4.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 56.04 α = 90
b = 65.68 β = 90
c = 55.69 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD SBC-3 -- 2005-02-10
CCD ADSC QUANTUM 315 -- 2005-02-11
Diffraction Radiation
Monochromator Protocol
SI 111 CHANNEL SINGLE WAVELENGTH
SI 111 CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97932 APS 19-BM
SYNCHROTRON APS BEAMLINE 19-ID 0.91932 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 50 98.5 0.07 0.07 -- 8.1 -- 15569 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.95 2.02 100.0 0.539 0.471 3.3 8.6 1531

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD/SAD 2.0 50.0 -- 0.0 14438 13472 715 98.26 0.23129 0.23129 0.22944 0.26671 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.052 -- 61 996 0.23 0.291 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 37.765
Anisotropic B[1][1] -2.29
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.53
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.75
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 4.916
r_scbond_it 3.631
r_mcangle_it 1.888
r_mcbond_it 1.454
r_symmetry_hbond_refined 0.176
r_bond_refined_d 0.022
r_angle_refined_deg 1.667
r_dihedral_angle_1_deg 5.153
r_dihedral_angle_2_deg 33.921
r_dihedral_angle_3_deg 13.892
r_dihedral_angle_4_deg 16.246
r_chiral_restr 0.112
r_gen_planes_refined 0.007
r_nbd_refined 0.219
r_nbtor_refined 0.31
r_xyhbond_nbd_refined 0.162
r_symmetry_vdw_refined 0.194
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1596
Nucleic Acid Atoms 0
Heterogen Atoms 8
Solvent Atoms 36

Software

Computing
Computing Package Purpose
SBCCOLLECT Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
HKL-3000, SHELXD, MLPHARE, MLPHARE, DM, SOLVE/RESOLVE, O, COOT, CCP4. Structure Solution
REFMAC 5.2.0005 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.2.0005 refinement