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X-RAY DIFFRACTION
Materials and Methods page
1Z5M
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 298.0
    Details Ammonium Sulfate, Tris, EDTA, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 124.61 α = 90
    b = 124.61 β = 90
    c = 46.97 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 94.2
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 4
    Collection Date 2003-06-22
     
    Diffraction Radiation
    Monochromator single crystal Si(220); cylindrically bent
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 5.0.1
    Wavelength List 1.
    Site ALS
    Beamline 5.0.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.17
    Resolution(Low) 20
    Number Reflections(All) 22440
    Number Reflections(Observed) 21597
    Percent Possible(Observed) 96.2
    B(Isotropic) From Wilson Plot 36.4
    Redundancy 3.417
     
    High Resolution Shell Details
    Resolution(High) 2.17
    Resolution(Low) 2.31
    Percent Possible(All) 91.2
    Mean I Over Sigma(Observed) 2.14
    R-Sym I(Observed) 0.347
    Redundancy 2.77
    Number Unique Reflections(All) 3380
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.17
    Resolution(Low) 8.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 22377
    Number of Reflections(Observed) 21580
    Number of Reflections(R-Free) 915
    Percent Reflections(Observed) 96.4
    R-Factor(All) 0.232
    R-Factor(Observed) 0.219
    R-Work 0.212
    R-Free 0.269
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model Overall
    Mean Isotropic B Value 25.7
    Anisotropic B[1][1] 1.18
    Anisotropic B[1][2] 1.61
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.18
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.35
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.17
    Shell Resolution(Low) 2.27
    Number of Reflections(Observed) 2094
    Number of Reflections(R-Free) 85
    R-Factor(R-Work) 0.309
    R-Factor(R-Free) 0.373
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.27
    Shell Resolution(Low) 2.38
    Number of Reflections(Observed) 2380
    Number of Reflections(R-Free) 110
    R-Factor(R-Work) 0.29
    R-Factor(R-Free) 0.33
    Percent Reflections(Observed) 95.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.38
    Shell Resolution(Low) 2.53
    Number of Reflections(Observed) 2529
    Number of Reflections(R-Free) 103
    R-Factor(R-Work) 0.268
    R-Factor(R-Free) 0.318
    Percent Reflections(Observed) 98.2
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.53
    Shell Resolution(Low) 2.72
    Number of Reflections(Observed) 2610
    Number of Reflections(R-Free) 124
    R-Factor(R-Work) 0.251
    R-Factor(R-Free) 0.34
    Percent Reflections(Observed) 98.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.72
    Shell Resolution(Low) 2.98
    Number of Reflections(Observed) 2628
    Number of Reflections(R-Free) 120
    R-Factor(R-Work) 0.222
    R-Factor(R-Free) 0.255
    Percent Reflections(Observed) 97.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.98
    Shell Resolution(Low) 3.38
    Number of Reflections(Observed) 2636
    Number of Reflections(R-Free) 107
    R-Factor(R-Work) 0.201
    R-Factor(R-Free) 0.265
    Percent Reflections(Observed) 97.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.38
    Shell Resolution(Low) 4.15
    Number of Reflections(Observed) 2677
    Number of Reflections(R-Free) 118
    R-Factor(R-Work) 0.163
    R-Factor(R-Free) 0.22
    Percent Reflections(Observed) 97.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.15
    Shell Resolution(Low) 8.0
    Number of Reflections(Observed) 2675
    Number of Reflections(R-Free) 90
    R-Factor(R-Work) 0.179
    R-Factor(R-Free) 0.235
    Percent Reflections(Observed) 95.7
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_improper_angle_d 1.46
    x_angle_deg 1.77
    x_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2255
    Nucleic Acid Atoms 0
    Heterogen Atoms 59
    Solvent Atoms 74
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) BLU-ICE
    Data Reduction (data scaling) XENGEN
    Structure Solution MOLREP
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building MolRep
    data reduction XENGEN
    data collection BluIce