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X-RAY DIFFRACTION
Materials and Methods page
1YTI
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.7 α = 90
    b = 32.5 β = 90
    c = 97.7 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Number Reflections(Observed) 4900
    Percent Possible(Observed) 93.0
    R Merge I(Observed) 0.053
    Redundancy 4.0
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.2
    Resolution(Low) 7.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 21000
    R-Factor(Observed) 0.211
    R-Work 0.211
    R-Free 0.295
     
    Temperature Factor Modeling
    Mean Isotropic B Value 29.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.016
    x_angle_deg 3.1
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 779
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 19
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Structure Solution X-PLOR
    Structure Refinement X-PLOR
     
    Software
    refinement X-PLOR
    model building X-PLOR