X-RAY DIFFRACTION Experimental Data & Validation


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Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 63.7 α = 90
b = 32.5 β = 90
c = 97.7 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU -- --
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 93.0 0.053 -- -- 4.0 -- 4900 -- 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.2 7.0 -- 0.0 -- 21000 -- -- -- 0.211 0.211 0.295 --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 29.0
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.016
x_angle_deg 3.1
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 779
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 19

Software

Computing
Computing Package Purpose
DENZO Data Reduction (intensity integration)
X-PLOR Structure Solution
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
X-PLOR model building