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X-RAY DIFFRACTION
Materials and Methods page
1YTB
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 295.0
    Details pH 7.50, VAPOR DIFFUSION, HANGING DROP, temperature 295.00K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 100.77 α = 90
    b = 100.77 β = 90
    c = 66.5 γ = 90
     
    Space Group
    Space Group Name:    P 43
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector AREA DETECTOR
    Type XENTRONICS
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Number Reflections(Observed) 59705
    Percent Possible(Observed) 98.5
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.8
    Resolution(Low) 6.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 51009
    Percent Reflections(Observed) 86.7
    R-Factor(Observed) 0.201
    R-Work 0.201
    R-Free 0.261
     
    Temperature Factor Modeling
    Mean Isotropic B Value 35.1
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_improper_angle_d 1.38
    x_bond_d 0.015
    x_angle_deg 1.56
    x_dihedral_angle_d 31.2
     
    Coordinate Error
    Luzzati Sigma A(Observed) 0.3
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2832
    Nucleic Acid Atoms 1194
    Heterogen Atoms 0
    Solvent Atoms 513
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement X-PLOR
     
    Software
    refinement X-PLOR