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X-RAY DIFFRACTION
Materials and Methods page
1YET
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 53.7 α = 90
    b = 44.3 β = 116.1
    c = 54.65 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU
    Collection Date 1997-01-03
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Number Reflections(Observed) 16906
    Percent Possible(Observed) 92.2
    R Merge I(Observed) 0.025
    Redundancy 5.1
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.9
    Resolution(Low) 6.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 16080
    R-Factor(Observed) 0.193
    R-Work 0.193
     
    Temperature Factor Modeling
    Mean Isotropic B Value 12.04
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_mcbond_it 2.789
    x_bond_d 0.007
    x_angle_deg 1.442
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1678
    Nucleic Acid Atoms 0
    Heterogen Atoms 40
    Solvent Atoms 274
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL
    Structure Solution X-PLOR
    Structure Refinement X-PLOR
     
    Software
    refinement X-PLOR
    model building X-PLOR