ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Concentration (mg/ml) 1.0
Sample pH 6.5
Sample Support Details HOLEY CARBON
Sample Vitrification Details VITRIFIED
Sample Aggregation State PARTICLE
Name of Sample CLATHRIN D6 COATS
Sample Details COATS ASSEMBLED WITH AP-2 WITH OR WITHOUT LIGHT
EM Data Acquisition
Date of Experiment --
Num of Micrographs-Images Used 225
Temperature (Kelvin) 93.0
Microscope Model FEI TECNAI F20
Detector Type KODAK SO163 FILM
Minimum Defocus (nm) 2000.0
Maximum Defocus (nm) 5000.0
Minimum Tilt Angle (degrees) 0.0
Maximum Tilt Angle (degrees) 0.0
Nominal CS 2.0
Imaging Mode BRIGHT FIELD
Electron Dose (electrons nm**-2) 2000.0
Illumination Mode FLOOD BEAM
Nominal Magnification 50000
Calibrated Magnification 51160
Source FEG
Acceleration Voltage (kV) 200
Imaging Details low dose
3D Reconstruction
Software Package(s)
Reconstruction Method FOURIER SPACE RECONSTRUCTION
EM Image Reconstruction Statistics
Number of Particles 1450
Actual Pixel Size 2.8
Effective Resolution 7.9
CTF Correction Method CTFTILT, FREALIGN V.6.07
Other Details The coordinates contain only a CA trace. Please see paper(Nature paper reference) for further details.
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
REAL MAVE DENSITY CORRELATION -- VISUAL --