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ELECTRON MICROSCOPY
Materials and Methods page
1XI4
  •   EM Refinement Details Hide
    3D Reconstruction
    Reconstruction Method FOURIER SPACE RECONSTRUCTION
     
    EM Map-Model Fitting & Refinement
    Refinement Space REAL
    Refinement Protocol MAVE
    Refinement Target DENSITY CORRELATION
    Fitting Procedure VISUAL
     
    EM Image Reconstruction Statistics
    Number of Particles 1450
    Actual Pixel Size 2.8
    Effective Resolution 7.9
    CTF Correction Method CTFTILT, FREALIGN V.6.07
    Other Details The coordinates contain only a CA trace. Please see paper(Nature paper reference) for further details.
     
    Electron Microscope Sample
    Sample Concentration (mg/ml) 1.0
    Sample pH 6.5
    Sample Support Details HOLEY CARBON
    Sample Vitrification Details VITRIFIED
    Sample Aggregation State PARTICLE
    Name of Sample CLATHRIN D6 COATS
    Sample Details COATS ASSEMBLED WITH AP-2 WITH OR WITHOUT LIGHT
     
    Data Acquisition
    Num of Micrographs-Images Used 225
    Temperature (Kelvin) 93.0
    Microscope Model FEI TECNAI F20
    Detector Type KODAK SO163 FILM
    Minimum Defocus (NM) 2000.0
    Maximum Defocus (NM) 5000.0
    Minimum Tilt Angle (degrees) 0.0
    Maximum Tilt Angle (degrees) 0.0
    Nominal CS 2.0
    Imaging Mode BRIGHT FIELD
    Electron Dose (electrons nm**-2) 2000.0
    Illumination Mode FLOOD BEAM
    Nominal Magnification 50000
    Calibrated Magnification 51160
    Source FEG
    Acceleration Voltage (KV) 200
    Imaging Details low dose