X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 4.8
Temperature 298.0
Details PEG 4000, sodium acetate, pH 4.8, VAPOR DIFFUSION, SITTING DROP, temperature 298.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 161.89 α = 90
b = 161.89 β = 90
c = 88.46 γ = 120
Symmetry
Space Group P 63

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 2003-10-25
Diffraction Radiation
Monochromator Protocol
double crystal monochromator Si(111) or (220) MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C 1.006, 1.011, 0.969, 1.1 NSLS X12C
SYNCHROTRON NSLS BEAMLINE X25 0.9787, 0.9791, 0.9635, 1.1 NSLS X25
SYNCHROTRON NSLS BEAMLINE X25 -- NSLS X25

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3 50 99.1 -- 0.078 -- 10.0 26365 26365 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.0 3.11 99.9 -- 0.48 5.0 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 3.0 20.0 -- 0.0 -- 24943 1301 50.0 -- 0.23626 0.23459 0.26833 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.0 3.076 -- 103 1811 0.332 0.413 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 41.591
Anisotropic B[1][1] -3.65
Anisotropic B[1][2] -1.82
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -3.65
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 5.47
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 2.597
r_scbond_it 1.587
r_mcangle_it 0.938
r_mcbond_it 0.458
r_symmetry_vdw_refined 0.316
r_nbd_refined 0.254
r_gen_planes_refined 0.004
r_chiral_restr 0.083
r_dihedral_angle_1_deg 6.603
r_angle_refined_deg 1.524
r_bond_refined_d 0.012
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4894
Nucleic Acid Atoms 813
Heterogen Atoms 23
Solvent Atoms 0

Software

Computing
Computing Package Purpose
ACE Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SHARP Structure Solution
REFMAC 5.1.80 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.1.80 refinement