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X-RAY DIFFRACTION
Materials and Methods page
1V2V
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6
    Temperature 294.0
    Details ammonium sulphate, MES, pH 6, VAPOR DIFFUSION, SITTING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 61.63 α = 90
    b = 70.58 β = 90
    c = 64.13 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 287
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV
    Details NI FILTER
    Collection Date 2002-07-29
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RU300
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.34
    Resolution(Low) 46.33
    Number Reflections(Observed) 42089
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 1.8
    Resolution(Low) 10.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 26072
    Number of Reflections(R-Free) 2615
    R-Work 0.222
    R-Free 0.249
     
    Temperature Factor Modeling
    Data Not Available
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1622
    Nucleic Acid Atoms 0
    Heterogen Atoms 15
    Solvent Atoms 53
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) CRYSTALCLEAR
    Data Reduction (data scaling) CRYSTALCLEAR
    Structure Solution CNS
    Structure Refinement CNS 1.0
     
    Software
    refinement CNS version: 1.0
    model building CNS
    data reduction CRYSTALCLEAR
    data collection CRYSTALCLEAR