X-RAY DIFFRACTION Experimental Data & Validation


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Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 117.5 α = 90
b = 67.9 β = 105.5
c = 108.8 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS II -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- -- 0.057 -- -- 3.36 -- n/a -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.2 6.0 -- 2.0 -- 34275 -- -- -- 0.202 0.202 -- --
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.011
x_angle_deg 2.46
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4586
Nucleic Acid Atoms 855
Heterogen Atoms 3
Solvent Atoms 384

Software

Computing
Computing Package Purpose
X-PLOR, TNT Structure Refinement
Software
Software Name Purpose
TNT refinement
X-PLOR refinement