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X-RAY DIFFRACTION
Materials and Methods page
1TSR
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.5 α = 90
    b = 67.9 β = 105.5
    c = 108.8 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 98
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IIC
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Wavelength 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.2
    Resolution(Low) 100
    Number Reflections(Observed) 36754
    Percent Possible(Observed) 86.0
    R Merge I(Observed) 0.057
    Redundancy 3.4
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.2
    Resolution(Low) 6.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 34275
    Percent Reflections(Observed) 85.7
    R-Factor(Observed) 0.205
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    t_angle_deg 2.76
    t_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4586
    Nucleic Acid Atoms 855
    Heterogen Atoms 3
    Solvent Atoms 384
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement TNT
     
    Software
    refinement TNT