X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 285.0
Details PEG3350, MAGNESIUM CHLORIDE, CALCIUM CHLORIDE, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 285K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 63.37 α = 90
b = 86.56 β = 90
c = 229.2 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD BRANDEIS - B4 -- 2000-03-09
CCD BRANDEIS - B4 -- 2000-03-10
CCD BRANDEIS - B1.3 -- 2001-04-12
CCD ADSC QUANTUM 4 -- 2002-03-20
Diffraction Radiation
Monochromator Protocol
Rh-COATED Si SINGLE WAVELENGTH
CHANNEL-CUT Si(111) MAD
CHANNEL-CUT Si(111) SINGLE WAVELENGTH
CHANNEL-CUT Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CHESS BEAMLINE A1 0.935 CHESS A1
SYNCHROTRON NSLS BEAMLINE X12C 0.9803, 1.0097, 1.0106 NSLS X12C
SYNCHROTRON NSLS BEAMLINE X25 1.100 NSLS X25
SYNCHROTRON NSLS BEAMLINE X25 1.100 NSLS X25

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 30 88.8 0.049 0.054 -- 4.2 32016 28745 1.0 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.8 2.9 80.8 0.206 0.307 2.3 2.0 3154

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MIR + MAD 2.8 30.0 -- 0.0 31911 28745 1098 90.1 0.258 0.262 0.252 0.296 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.8 2.9 2409 72 -- 0.388 0.446 0.035 76.4
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.19
x_angle_deg 1.94
x_dihedral_angle_d 25.56
x_bond_d 0.019
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.45
Luzzati Sigma A (Observed) 0.55
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.56
Luzzati Sigma A (R-Free Set) 0.63
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7010
Nucleic Acid Atoms 0
Heterogen Atoms 72
Solvent Atoms 189

Software

Software
Software Name Purpose
DENZO data reduction
SCALEPACK data scaling
MLPHARE phasing
CNS refinement