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X-RAY DIFFRACTION
Materials and Methods page
1RTI
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 140.8 α = 90
    b = 111.2 β = 90
    c = 73 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type MAR scanner 300 mm plate
    Collection Date 1994-05-05
     
    Diffraction Radiation
     
    Diffraction Source
    Source SYNCHROTRON
    Type SRS BEAMLINE PX9.6
    Wavelength List 0.882
    Site SRS
    Beamline PX9.6
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3
    Resolution(Low) 25
    Number Reflections(Observed) 20390
    Percent Possible(Observed) 86.3
    R Merge I(Observed) 0.123
    Redundancy 8.04
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 3.0
    Resolution(Low) 25.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 20390
    Percent Reflections(Observed) 86.3
    R-Factor(Observed) 0.236
    R-Work 0.236
     
    Temperature Factor Modeling
    Mean Isotropic B Value 62.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_improper_angle_d 1.2
    x_bond_d 0.005
    x_angle_deg 1.2
    x_dihedral_angle_d 23.2
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7836
    Nucleic Acid Atoms 0
    Heterogen Atoms 21
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1