X-RAY DIFFRACTION Experimental Data & Validation


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Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 141.1 α = 90
b = 110.9 β = 90
c = 73.3 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE FUJI -- 1993-03-03
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-6A 0.970 PHOTON FACTORY BL-6A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 25 81.4 0.144 -- -- 9.46 -- 48144 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.2 25.0 -- 0.0 -- 48144 -- 81.4 -- 0.214 0.214 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 61.0
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.9
x_bond_d 0.017
x_angle_deg 2.1
x_dihedral_angle_d 25.3
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7887
Nucleic Acid Atoms 0
Heterogen Atoms 22
Solvent Atoms 237

Software

Computing
Computing Package Purpose
DENZO Data Reduction (intensity integration)
X-PLOR 3.1 Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.1 refinement
X-PLOR version: 3.1 model building