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X-RAY DIFFRACTION
Materials and Methods page
1RTH
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 141.1 α = 90
    b = 110.9 β = 90
    c = 73.3 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type FUJI
    Collection Date 1993-03-03
     
    Diffraction Radiation
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-6A
    Wavelength List 0.970
    Site PHOTON FACTORY
    Beamline BL-6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.2
    Resolution(Low) 25
    Number Reflections(Observed) 48144
    Percent Possible(Observed) 81.4
    R Merge I(Observed) 0.144
    Redundancy 9.46
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.2
    Resolution(Low) 25.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 48144
    Percent Reflections(Observed) 81.4
    R-Factor(Observed) 0.214
    R-Work 0.214
     
    Temperature Factor Modeling
    Mean Isotropic B Value 61.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_improper_angle_d 1.9
    x_bond_d 0.017
    x_angle_deg 2.1
    x_dihedral_angle_d 25.3
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7887
    Nucleic Acid Atoms 0
    Heterogen Atoms 22
    Solvent Atoms 237
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1