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X-RAY DIFFRACTION
Materials and Methods page
1RLB
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 222.4 α = 90
    b = 163.4 β = 90
    c = 55.5 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Number Reflections(Observed) 17465
    Percent Possible(Observed) 94.8
    R Merge I(Observed) 0.09
    Redundancy 2.7
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 3.1
    Resolution(Low) 6.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 14891
    Percent Reflections(Observed) 93.5
    R-Factor(Observed) 0.215
    R-Work 0.215
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.018
    x_angle_deg 3.7
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6582
    Nucleic Acid Atoms 0
    Heterogen Atoms 42
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MSC
    Structure Solution X-PLOR
    Structure Refinement X-PLOR
     
    Software
    refinement X-PLOR
    model building X-PLOR
    data collection MSC