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X-RAY DIFFRACTION
Materials and Methods page
1RDT
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Temperature 295.0
    Details 17% PEG 4K, 200mM NaSCN, 8% ethylene glycol, 8% glycerol, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 295K, pH 7.50
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.69 α = 90
    b = 54.58 β = 90
    c = 211.7 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 93
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Collection Date 1999-08-08
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 17-ID
    Wavelength 1
    Site APS
    Beamline 17-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.3
    Resolution(Low) 20
    Number Reflections(Observed) 25137
    Percent Possible(Observed) 98.6
    R Merge I(Observed) 0.071
    B(Isotropic) From Wilson Plot 34.5
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Percent Possible(All) 86.6
    R Merge I(Observed) 0.422
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 20.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 21429
    Number of Reflections(R-Free) 2121
    Percent Reflections(Observed) 97.1
    R-Work 0.221
    R-Free 0.259
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model ANISOTROPIC
    Mean Isotropic B Value 41.3
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.55
    Number of Reflections(R-Free) 359
    Number of Reflections(R-Work) 3032
    R-Factor(R-Work) 0.235
    R-Factor(R-Free) 0.283
    R-Free Error 0.015
    Percent Reflections(Observed) 94.3
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_improper_angle_d 0.69
    c_bond_d 0.005
    c_angle_deg 1.3
    c_dihedral_angle_d 19.7
     
    Coordinate Error
    Luzzati ESD(Observed) 0.27
    Luzzati Sigma A(Observed) 0.16
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.34
    Luzzati Sigma A(R-Free Set) 0.23
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3753
    Nucleic Acid Atoms 0
    Heterogen Atoms 69
    Solvent Atoms 205
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNX 2000
    Structure Refinement CNX 2000
     
    Software
    refinement CNX version: 2000
    model building CNX version: 2000
    data reduction HKL-2000
    data collection HKL-2000