ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Concentration (mg/ml) 32.0
Sample Support Details Quantifoil holley carbon film grids
Sample Vitrification Details Rapid-freezing in liquid ethane
Sample Aggregation State PARTICLE
EM Data Acquisition
Date of Experiment --
Num of Micrographs-Images Used --
Temperature (Kelvin) 93.0
Microscope Model FEI TECNAI F20
Detector Type KODAK SO163 FILM
Minimum Defocus (nm) --
Maximum Defocus (nm) --
Minimum Tilt Angle (degrees) 0.0
Maximum Tilt Angle (degrees) 0.0
Nominal CS --
Imaging Mode BRIGHT FIELD
Electron Dose (electrons nm**-2) 2000.0
Illumination Mode FLOOD BEAM
Nominal Magnification 50000
Calibrated Magnification 49696
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details --
3D Reconstruction
Software Package(s)
Reconstruction Method 3D projection matching; conjugate gradient with regularization
EM Image Reconstruction Statistics
Actual Pixel Size 2.82
Effective Resolution 9.0
CTF Correction Method CTF correction of 3D maps by Wiener filteration
EM Reconstruction Magnification Callibration TMV
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
REAL -- -- -- Manual fitting in O SPIDER package