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X-RAY DIFFRACTION
Materials and Methods page
1QUV
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 295.7
    Details HANGING DROP, PEG 4000, SODIUM ACETATE, AMMONIUM ACETATE, TES, pH 6.00, VAPOR DIFFUSION, HANGING DROP, temperature 295.7K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.65 α = 90
    b = 63.65 β = 90
    c = 262.9 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type WEISSENBERG
    Collection Date 1998-12-08
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-6B
    Wavelength 1.000
    Site PHOTON FACTORY
    Beamline BL-6B
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.5
    Resolution(Low) 37.5
    Number Reflections(Observed) 19281
    Percent Possible(Observed) 98.2
    R Merge I(Observed) 0.046
    B(Isotropic) From Wilson Plot 36.1
    Redundancy 3.4
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.63
    Percent Possible(All) 98.2
    R Merge I(Observed) 0.064
    Mean I Over Sigma(Observed) 9.8
    Redundancy 3.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MIR
    reflnsShellList 2.5
    Resolution(Low) 20.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 19063
    Number of Reflections(R-Free) 1883
    Percent Reflections(Observed) 97.0
    R-Factor(Observed) 0.223
    R-Work 0.223
    R-Free 0.316
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 28.5
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.66
    Number of Reflections(R-Free) 308
    Number of Reflections(R-Work) 2758
    R-Factor(R-Work) 0.294
    R-Factor(R-Free) 0.428
    R-Free Error 0.024
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_scangle_it 5.87
    x_scbond_it 4.5
    x_mcangle_it 4.25
    x_mcbond_it 2.86
    x_improper_angle_d 0.8
    x_bond_d 0.01
    x_angle_deg 1.6
    x_dihedral_angle_d 26.7
     
    Coordinate Error
    Luzzati ESD(Observed) 0.3
    Luzzati Sigma A(Observed) 0.26
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.44
    Luzzati Sigma A(R-Free Set) 0.43
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4296
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 284
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) CCP4 (SCALA)
    Structure Solution SHARP, MLPHARE
    Structure Refinement X-PLOR 98.1
     
    Software
    refinement X-PLOR version: 98.1
    model building MLPHARE
    model building SHARP