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X-RAY DIFFRACTION
Materials and Methods page
1QQP
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details pH 7.50
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 345 α = 90
    b = 345 β = 90
    c = 345 γ = 90
     
    Space Group
    Space Group Name:    I 2 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 290
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MAR scanner 300 mm plate
     
    Diffraction Radiation
    Monochromator SI
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SRS BEAMLINE PX9.6
    Wavelength 0.87
    Site SRS
    Beamline PX9.6
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.9
    Resolution(Low) 12
    Number Reflections(Observed) 2070213
    Percent Possible(Observed) 91.0
    R Merge I(Observed) 0.143
    Redundancy 4.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method OTHER
    reflnsShellList 1.9
    Resolution(Low) 12.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 480760
    Percent Reflections(Observed) 91.0
    R-Factor(Observed) 0.161
    R-Work 0.161
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.013
    x_angle_deg 1.9
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5201
    Nucleic Acid Atoms 0
    Heterogen Atoms 85
    Solvent Atoms 631
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    data reduction SCALEPACK
    data collection DENZO