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X-RAY DIFFRACTION
Materials and Methods page
1QD7
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    Temperature 277.0
    Details VAPOUR DIFFUSION AT 277 K, MPD, VAPOR DIFFUSION
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 401.6 α = 90
    b = 401.6 β = 90
    c = 174.5 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type BRANDEIS - B4
    Collection Date 1999-03-04
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.000, 1.700
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 5.5
    Number Reflections(All) 42000
    Number Reflections(Observed) 42000
    Percent Possible(Observed) 95.0
    Redundancy 5.0
     
    High Resolution Shell Details
    Resolution(High) 5.5
    Percent Possible(All) 83.0
    Mean I Over Sigma(Observed) 5.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 5.5
    Number of Reflections(all) 42000
    Number of Reflections(Observed) 42000
     
    Temperature Factor Modeling
    Data Not Available
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 946
    Nucleic Acid Atoms 359
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution SOLVE
    Structure Refinement O
     
    Software
    refinement O
    model building SOLVE