X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.6
Temperature 295.0
Details 23-26 % (w/v) PEG 4000, 100 mM Na citrate, pH 5.6, 210-250 mM ammonium acetate, and 100 mM cesium chloride, VAPOR DIFFUSION, HANGING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 103.04 α = 90
b = 61.95 β = 97.01
c = 175.87 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 2002-05-20
Diffraction Radiation
Monochromator Protocol
Flat mirror (vertical focusing) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-1 1.0024 SSRL BL9-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 49.83 99.2 -- 0.084 -- -- 97443 86087 0.0 1.0 27.9
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.4 2.53 98.3 -- 0.368 2.0 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.4 49.83 -- 0.0 86841 86087 8627 99.1 0.22 0.27 0.22 0.273 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.4 2.51 10555 1103 9452 0.273 0.335 0.01 97.9
X Ray Diffraction 2.51 2.64 10579 1035 9544 0.264 0.328 0.01 98.3
X Ray Diffraction 2.64 2.81 10678 1054 9624 0.248 0.311 0.01 98.8
X Ray Diffraction 2.81 3.02 10734 1105 9629 0.247 0.305 0.009 99.4
X Ray Diffraction 3.02 3.33 10801 1074 9727 0.236 0.29 0.009 99.6
X Ray Diffraction 3.33 3.81 10832 1100 9732 0.218 0.259 0.008 99.7
X Ray Diffraction 3.81 4.8 10871 1057 9814 0.181 0.237 0.007 99.6
X Ray Diffraction 4.8 49.83 11037 1099 9938 0.201 0.245 0.007 99.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
Mean Isotropic B 33.68
Anisotropic B[1][1] 4.1
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.04
Anisotropic B[2][2] -5.97
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 1.87
RMS Deviations
Key Refinement Restraint Deviation
c_torsion_impr_deg 0.72
c_torsion_deg 22.8
c_angle_deg 1.1
c_bond_d 0.006
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.29
Luzzati Sigma A (Observed) 0.28
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.37
Luzzati Sigma A (R-Free Set) 0.38
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 15704
Nucleic Acid Atoms 0
Heterogen Atoms 176
Solvent Atoms 399

Software

Computing
Computing Package Purpose
MOSFLM Data Reduction (intensity integration)
CCP4 (SCALA) Data Reduction (data scaling)
MOLREP Structure Solution
CNS 1.1 Structure Refinement
Software
Software Name Purpose
Crystallography & NMR System version: 1.1 refinement