X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.6
Temperature 295.0
Details 23-26 % (w/v) PEG 4000, 100 mM Na citrate, pH 5.6, 210-250 mM ammonium acetate, and 100 mM cesium chloride, VAPOR DIFFUSION, HANGING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 61.1 α = 90
b = 180.39 β = 97.46
c = 96.63 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 Flat mirror (vertical focusing) 2003-01-26
Diffraction Radiation
Monochromator Protocol
single crystal Si(311) bent monochromator (horizontal focusing) MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-1 0.9789,0.9417,0.9793 SSRL BL9-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 24.22 99.6 -- 0.091 -- -- -- 91582 0.0 1.0 19.2
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.3 2.42 99.9 -- 0.311 2.3 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.3 19.98 -- 0.0 91625 91582 9160 99.8 0.203 0.249 0.203 0.249 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3 2.4 11364 1049 10315 0.231 0.295 0.009 99.7
X Ray Diffraction 2.4 2.53 11456 1186 10270 0.222 0.286 0.008 99.8
X Ray Diffraction 2.53 2.69 11459 1164 10295 0.222 0.269 0.008 99.9
X Ray Diffraction 2.69 2.9 11398 1084 10314 0.221 0.29 0.009 99.9
X Ray Diffraction 2.9 3.19 11429 1142 10287 0.221 0.278 0.008 99.9
X Ray Diffraction 3.19 3.65 11446 1177 10269 0.206 0.248 0.007 100.0
X Ray Diffraction 3.65 4.58 11466 1155 10311 0.179 0.212 0.006 99.9
X Ray Diffraction 4.58 19.98 11564 1203 10361 0.187 0.219 0.006 100.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
Mean Isotropic B 29.32
Anisotropic B[1][1] -2.49
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 3.35
Anisotropic B[2][2] -4.58
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 7.07
RMS Deviations
Key Refinement Restraint Deviation
c_scangle_it 2.97
c_mcangle_it 2.24
c_scbond_it 2.07
c_mcbond_it 1.39
c_torsion_impr_deg 0.78
c_torsion_deg 22.9
c_angle_deg 1.1
c_bond_d 0.007
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.25
Luzzati Sigma A (Observed) 0.2
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.32
Luzzati Sigma A (R-Free Set) 0.29
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 15301
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 312

Software

Computing
Computing Package Purpose
MOSFLM Data Reduction (intensity integration)
CCP4 (SCALA) Data Reduction (data scaling)
SOLVE Structure Solution
CNS 1.1 Structure Refinement
Software
Software Name Purpose
Crystallography & NMR System version: 1.1 refinement