X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.3
Temperature 298.0
Details 36% PEG 550 MME, 50 mM NaCl, 100 mM Tris pH 7.3, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 102.05 α = 90
b = 66.14 β = 105.78
c = 78.18 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD SBC-2 -- 2002-08-17
Diffraction Radiation
Monochromator Protocol
Si 220 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97945 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.35 50 95.5 -- 0.054 -- 3.14 104310 104310 0.0 0.0 13.578
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.35 1.4 68.4 -- 0.402 1.86 1.4 7413

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.35 33.52 0.0 0.0 104310 99104 5202 95.39 0.13389 0.13389 0.13185 0.17347 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.35 1.386 4703 237 4703 0.229 0.28 -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model anisotropic
Mean Isotropic B 8.13
Anisotropic B[1][1] -0.1
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -0.05
Anisotropic B[2][2] 0.02
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.05
RMS Deviations
Key Refinement Restraint Deviation
r_angle_refined_deg 1.626
r_chiral_restr 0.112
r_mcangle_it 3.117
r_bond_refined_d 0.013
r_angle_other_deg 1.381
r_symmetry_vdw_other 0.353
r_rigid_bond_restr 1.618
r_nbd_other 0.276
r_symmetry_vdw_refined 0.276
r_sphericity_free 16.123
r_nbd_refined 0.227
r_scangle_it 5.694
r_mcbond_it 2.338
r_sphericity_bonded 5.081
r_gen_planes_other 0.014
r_scbond_it 4.209
r_gen_planes_refined 0.011
r_symmetry_hbond_refined 0.229
r_bond_other_d 0.001
r_nbtor_other 0.104
r_dihedral_angle_1_deg 6.924
r_xyhbond_nbd_refined 0.165
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4095
Nucleic Acid Atoms 0
Heterogen Atoms 121
Solvent Atoms 630

Software

Software
Software Name Purpose
HKL-2000 data collection
TRUNCATE data reduction
XTALVIEW refinement
REFMAC refinement version: 5.1.24
HKL-2000 data reduction
CCP4 data scaling version: (TRUNCATE)