X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.8
Temperature 298.0
Details 32% PEG 5000, 100 mM Tris-HCl pH 7.8, 50 mM NaCl, VAPOR DIFFUSION, SITTING DROP, temperature 298.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 60.82 α = 90
b = 78.68 β = 116.2
c = 62.3 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD SBC-2 -- 2002-02-23
Diffraction Radiation
Monochromator Protocol
Si 220 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97934 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.99 50 95.3 -- 0.061 -- 3.45 34499 34499 0.0 0.0 20.322
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.99 2.07 84.1 -- 0.145 7.07 2.27 3005

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.99 27.95 0.0 0.0 34499 32749 1731 95.21 0.15778 0.15778 0.15449 0.2207 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.99 2.041 2009 118 -- 0.183 0.295 -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
Mean Isotropic B 15.815
Anisotropic B[1][1] 0.01
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.03
Anisotropic B[2][2] 0.03
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.02
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 4.461
r_scbond_it 3.017
r_mcangle_it 2.433
r_mcbond_it 1.656
r_symmetry_hbond_refined 0.244
r_symmetry_vdw_other 0.304
r_symmetry_vdw_refined 0.297
r_bond_refined_d 0.011
r_bond_other_d 0.001
r_angle_refined_deg 1.158
r_angle_other_deg 0.651
r_dihedral_angle_1_deg 6.338
r_chiral_restr 0.067
r_gen_planes_refined 0.004
r_gen_planes_other 0.002
r_nbd_refined 0.21
r_nbd_other 0.29
r_nbtor_other 0.088
r_xyhbond_nbd_refined 0.219
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4120
Nucleic Acid Atoms 0
Heterogen Atoms 168
Solvent Atoms 575

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
CCP4 (TRUNCATE) Data Reduction (data scaling)
XTALVIEW Structure Solution
REFMAC 5.1.24 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.1.24 refinement
XTALVIEW model building
TRUNCATE data reduction
HKL-2000 data collection