X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 293.0
Details amonium sulfate, sodium cacodylate, ethylene glycol, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 97.79 α = 90
b = 97.79 β = 90
c = 159.27 γ = 90
Symmetry
Space Group P 41 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 150
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD SBC-2 -- 2002-07-26
Diffraction Radiation
Monochromator Protocol
double crystal Si(111) MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97929,0.97918,0.96396 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 28.93 -- -- -- -- -- 18344 18344 0.0 -- 70.6

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.8 28.93 -- -- 19675 16773 844 85.3 -- -- 0.244 0.279 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.8 2.93 1280 61 1219 0.446 0.472 0.06 53.4
X Ray Diffraction 2.93 3.08 1754 95 1659 0.393 0.435 0.045 72.7
X Ray Diffraction 3.08 3.27 2079 95 1984 0.32 0.337 0.035 86.0
X Ray Diffraction 3.27 3.53 2186 103 2083 0.291 0.306 0.03 90.1
X Ray Diffraction 3.53 3.88 2283 106 2177 0.249 0.279 0.027 93.8
X Ray Diffraction 3.88 4.44 2351 129 2222 0.207 0.257 0.023 95.1
X Ray Diffraction 4.44 5.59 2378 128 2250 0.187 0.23 0.02 96.0
X Ray Diffraction 5.59 28.93 2462 127 2335 0.233 0.266 0.024 93.1
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 75.24
Anisotropic B[1][1] 15.85
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 15.85
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -31.71
RMS Deviations
Key Refinement Restraint Deviation
x_torsion_impr_deg 0.93
x_torsion_deg 24.0
x_angle_deg 1.4
x_bond_d 0.008
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.43
Luzzati Sigma A (Observed) 0.73
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.49
Luzzati Sigma A (R-Free Set) 0.71
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1982
Nucleic Acid Atoms 0
Heterogen Atoms 25
Solvent Atoms 88

Software

Computing
Computing Package Purpose
DTCOLLECT, HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
SOLVE, SHARP Structure Solution
CNS 1.1 Structure Refinement
Software
Software Name Purpose
Crystallography & NMR System version: 1.1 refinement