X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.6
Temperature 293.0
Details sodium acetate, ammonium sulfate, glycerol, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 184.78 α = 90
b = 184.78 β = 90
c = 184.78 γ = 90
Symmetry
Space Group F 2 3

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH -- 2001-09-01
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE BM30A 0.98900 ESRF BM30A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.87 99 98.5 0.033 -- -- -- 42928 42928 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.87 1.91 86.5 0.187 -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
AB INITIO 1.87 99.0 -- 0.0 42928 42928 2153 98.5 0.215 -- 0.213 0.269 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.87 1.91 4853 -- -- -- -- -- 86.5
X Ray Diffraction 1.91 1.96 5302 -- -- -- -- -- 94.5
X Ray Diffraction 1.96 2.01 5627 -- -- -- -- -- 99.6
X Ray Diffraction 2.01 2.07 5654 -- -- -- -- -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
s_non_zero_chiral_vol 0.052
s_rigid_bond_adp_cmpnt 0.0
s_bond_d 0.007
s_from_restr_planes 0.0238
s_zero_chiral_vol 0.033
s_similar_dist 0.0
s_angle_d 0.023
s_approx_iso_adps 0.0
s_anti_bump_dis_restr 0.192
s_similar_adp_cmpnt 0.084
Coordinate Error
Parameter Value
Number Disordered Residues 0.0
Occupancy Sum Hydrogen 0.0
Occupancy Sum Non Hydrogen 2648.48
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2454
Nucleic Acid Atoms 0
Heterogen Atoms 8
Solvent Atoms 191

Software

Software
Software Name Purpose
SHELX model building
SHELXL-97 refinement
DENZO data reduction
SCALEPACK data scaling
SHELX phasing